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Behavior of Si Photoelectrodes under High Level Injection Conditions. 2. Experimental Measurements and Digital Simulations of the Behavior of Quasi-Fermi Levels under Illumination and Applied Bias
Krüger Olaf, Kenyon C. N., Tan Ming X., Lewis Nathan S.
Behavior of Si Photoelectrodes under High Level Injection Conditions. 1. Steady-State Current−Voltage Properties and Quasi-Fermi Level Positions under Illumination. Tan Ming X. (1997) J. Phys. Chem. B.
The concept of Fermi level pinning at semiconductor/liquid junctions. Consequences for energy conversion efficiency and selection of useful solution redox couples in solar devices. Bard Allen J. (1980) J. Am. Chem. Soc..
Photoelectrochemical reduction of N,N'-dimethyl-4,4'-bipyridinium in aqueous media at p-type silicon: sustained photogeneration of a species capable of evolving hydrogen. Bookbinder Dana C. (1979) J. Am. Chem. Soc..
Behavior of Si Photoelectrodes under High Level Injection Conditions. 2. Experimental Measurements and Digital Simulations of the Behavior of Quasi-Fermi Levels under Illumination and Applied Bias. Krüger Olaf (1997) J. Phys. Chem. B.
the focus will be on the first of the 3Si-HLI papers. The 1994 Ming Tan paper is the first report of the selective ohmic backcontact experimental setup by the Lewis group
- Emily Warren(Caltech)August 31, 2009Comment deleted